Infra-red faraday rotation in semiconductors: Double beam phase-sensitive method for the measurement of infra-red Faraday rotation, ellipticity and Voigt effect
- 31 March 1964
- journal article
- Published by Elsevier in Infrared Physics
- Vol. 4 (1) , 13-28
- https://doi.org/10.1016/0020-0891(64)90040-5
Abstract
No abstract availableThis publication has 20 references indexed in Scilit:
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