The growth of indium on the Si(111) surface studied by X-ray reflectivity and Auger electron spectroscopy
- 20 October 1992
- journal article
- Published by Elsevier in Surface Science
- Vol. 277 (3) , 330-336
- https://doi.org/10.1016/0039-6028(92)90772-x
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
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