Reflectivity of HgSe and HgTe from 4 to 12 eV at 12 and 300°K
- 3 February 1964
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 133 (3A) , A736-A739
- https://doi.org/10.1103/PhysRev.133.A736
Abstract
The reflectivity of etched samples of HgSe and HgTe has been measured from 4-12 eV (3000-1050 Å) at room and He temperatures. Several peaks found in the reflectivity spectrum have been assigned to interband transitions at the and points in the Brillouin zone. Doublets, which are due to the effect of spin-orbid interaction, are resolved when the samples are cooled to He temperature. The values for splitting (valence band) for both HgSe and HgTe are in agreement with other measurements of these materials in the visible region where a doublet due to transitions is found. Other transitions are also discussed.
Keywords
This publication has 19 references indexed in Scilit:
- Absorption Spectrum of Germanium and Zinc-Blende-Type Materials at Energies Higher than the Fundamental Absorption EdgeJournal of Applied Physics, 1963
- Fundamental Reflectivity of GaAs at Low TemperaturePhysical Review Letters, 1962
- Reflectivity of Gray Tin Single Crystals in the Fundamental Absorption RegionPhysical Review B, 1962
- Observation ofBands in 3-5 SemiconductorsPhysical Review Letters, 1962
- Bonding and Antibonding Spin-Orbit SplittingsPhysical Review Letters, 1962
- Interband Transitions in Groups 4, 3-5, and 2-6 SemiconductorsPhysical Review Letters, 1962
- Reflectivity and Optical Constants of Indium Arsenide, Indium Antimonide, and Gallium ArsenidePhysical Review B, 1961
- Optical Constants of Silicon in the Region 1 to 10 evPhysical Review B, 1960
- Optical absorption in germaniumJournal of Physics and Chemistry of Solids, 1960
- Optical Constants of Germanium in the Region 1 to 10 evPhysical Review B, 1959