The use of an LMIS and argon ion sputtering in studies of thin film strain gauges
- 1 January 1984
- Vol. 34 (1) , 321-325
- https://doi.org/10.1016/0042-207x(84)90149-0
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Three-dimensional strain coefficients of resistivity of thin polycrystalline metal filmsJournal of Materials Science, 1981
- Three-dimensional analytical expressions of strain gauge coefficients of infinitely thick polycrystalline metal filmsJournal of Materials Science, 1980
- Size effect in the longitudinal and transverse strain coefficients of resistance in metal filmsThin Solid Films, 1978
- Size effect in strain coefficient of resistivityThin Solid Films, 1970
- Electrical-Resistivity Model for Polycrystalline Films: the Case of Arbitrary Reflection at External SurfacesPhysical Review B, 1970
- Effect of Elastic Strain on the Electrical Resistance of MetalsPhysical Review B, 1954