Complicated Average Stress-Fields and Attempts at Their Evaluation with X-ray Diffraction Methods
- 1 January 1994
- book chapter
- Published by Springer Nature
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Determination of depth profiles from X-ray diffraction dataPowder Diffraction, 1993
- Evaluation of the stress field in a ground steel plate from energy-dispersive X-ray diffraction experimentsMaterials Science and Engineering: A, 1993
- σxx(z) andσyy(z) stress-fields calculated from diffraction experiments performed with synchrotron radiation in theΩ- andΨ-mode techniquesZeitschrift für Kristallographie, 1991
- Residual Stresses in Alumina/Silicon Carbide (Whisker) Composites by X‐ray DiffractionJournal of the American Ceramic Society, 1990