Rutherford backscattering analysis of electroless gold contacts on cadmium telluride

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Abstract
In order to clarify the physical properties of electroless gold contacts on CdTe crystals, Rutherford backscattering measurements have been performed using a 4-MeV 4He beam. Backscattering spectra show that a sharp gold film grows on the crystal surface and that a strong chemical reaction takes place between the substrate and the gold chloride solution used for the electroless Au deposition. Depth profile analyses, supported by Auger spectroscopy results, confirm that the Au-CdTe interface region becomes significantly lower in cadmium atom concentration. This feature can probably explain the electrical behavior of such gold contacts (ohmic on p type and rectifying on n-type CdTe).