Application of the Finite Element Method to Determine the Electrical Resistance, Inductance, Capacitance parameters for the Circuit Package Enviornment
- 1 December 1982
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Components, Hybrids, and Manufacturing Technology
- Vol. 5 (4) , 486-492
- https://doi.org/10.1109/tchmt.1982.1135980
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Finite-Element Analysis of Semiconductor Devices: The FIELDAY ProgramIBM Journal of Research and Development, 1981
- Multiconductor Transmission-line Theory in the TEM ApproximationIBM Journal of Research and Development, 1972
- Calculation of Coefficients of Capacitance of Multiconductor Transmission Lines in the Presence of a Dielectric InterfaceIEEE Transactions on Microwave Theory and Techniques, 1970
- High-order polynomial triangular finite elements for potential problemsInternational Journal of Engineering Science, 1969