Electronic Chip-In-Place Test

Publisher Website

1 January 1982

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/dac.1982.1585542

Abstract

No abstract available

This publication has 1 reference indexed in Scilit:

Automatic System Level Test a Fault Location for Large Digital Systems
Published by Institute of Electrical and Electronics Engineers (IEEE) ,1978