Instrumental factors in high-resolution FEG STEM
- 30 April 1995
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 58 (1) , 1-5
- https://doi.org/10.1016/0304-3991(94)00172-j
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- High-resolution Z-contrast imaging of crystalsPublished by Elsevier ,2002
- Atomic resolution Z-contrast imaging of interfacesActa Metallurgica et Materialia, 1992