A Study of Free- and Bound-Exciton Recombination in Device Quality Diamond
- 1 January 1995
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
A cathodoluminescence (CL) study of free- and bound-exciton recombination in high purity high pressure high temperature (HPHT) synthetic diamond is presented, including temperature dependence measurements of the free-exciton intensity and luminescence decaytime. The results are compared with those from device quality diamond produced using the chemical vapour deposition (CVD) process.Keywords
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