A new totally reflecting X-ray fluorescence spectrometer with detection limits below 10−11 g
- 1 January 1980
- journal article
- Published by Springer Nature in Analytical and Bioanalytical Chemistry
- Vol. 301 (1) , 7-9
- https://doi.org/10.1007/bf00481262
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Trace element enrichment on a quartz glass surface used as a sample support of an X-ray spectrometer for the subnanogram rangeAnalytical and Bioanalytical Chemistry, 1979
- An X-ray fluorescence spectrometer with totally reflecting sample support for trace analysis at the ppb levelAnalytical and Bioanalytical Chemistry, 1978
- A method for quantitative X-ray fluorescence analysis in the nanogram regionNuclear Instruments and Methods, 1974
- Optical Flats for Use in X-Ray Spectrochemical MicroanalysisReview of Scientific Instruments, 1971