Function test methods using test cells for ATM switching system
- 19 November 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 2, 982-987
- https://doi.org/10.1109/icc.1995.524248
Abstract
No abstract availableKeywords
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- ATM switching node system technology for effective maintainabilityPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Evolving from narrowband (ISDN)IEEE Communications Magazine, 1992