Self-heating and Temperature Measurement in Sub-µm-MOSFETs

Publisher Website

1 January 1989

book chapter
Published by Springer Nature

p. 675-678
https://doi.org/10.1007/978-3-642-52314-4_141

Abstract

No abstract available

This publication has 1 reference indexed in Scilit:

Thermal effects in JFET and MOSFET devices at cryogenic temperatures
IEEE Transactions on Electron Devices, 1972