Analysis of chemical-vapour-deposited diamond grain boundaries using transmission electron microscopy and parallel electron energy loss spectroscopy in a scanning transmission electron microscope
- 24 April 1993
- journal article
- Published by Elsevier in Diamond and Related Materials
- Vol. 2 (5-7) , 1004-1011
- https://doi.org/10.1016/0925-9635(93)90265-4
Abstract
No abstract availableKeywords
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