Scanning force microscopy study of domain structure in pb (zrxti1-x)o3thin films and pt/pzt/pt and ruo2/pzt/ruo2capacitors
- 1 February 1997
- journal article
- Published by Taylor & Francis in Integrated Ferroelectrics
- Vol. 15 (1-4) , 107-114
- https://doi.org/10.1080/10584589708015701
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Strain-Imaging Observation of Pb(Zr, Ti)O3 Thin FilmsJapanese Journal of Applied Physics, 1995
- Science and Technology of Electroceramic Thin FilmsPublished by Springer Nature ,1995
- Electronic domain pinning in Pb(Zr,Ti)O3 thin films and its role in fatigueApplied Physics Letters, 1994
- Domain configurations due to multiple misfit relaxation mechanisms in epitaxial ferroelectric thin films. II. Experimental verification and implicationsJournal of Applied Physics, 1994
- Modification and detection of domains on ferroelectric PZT films by scanning force microscopySurface Science, 1994
- Piezoelectric properties of sol-gel-derived ferroelectric and antiferroelectric thin layersJournal of Applied Physics, 1994