Resonant trapping: A failure mechanism in switch transitions
- 1 January 1997
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review E
- Vol. 55 (1) , 36-39
- https://doi.org/10.1103/physreve.55.36
Abstract
Stochastic resonance in a time-modulated bistable system is shown to survive at modulation amplitudes larger than the relevant dynamical bistability threshold. Residual stochastic resonance is related to a synchronization-loss mechanism (resonant trapping), which attains its maximum effect for noise-intensities proportional to the excess modulation amplitude. Such a phenomenon provides an effective model of noise- induced failures in switch devices.Keywords
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