Scanning force microscopy - With Applications to Electric, Magnetic and Atomic Forces
- 1 January 1991
- journal article
- Published by EDP Sciences in Microscopy Microanalysis Microstructures
- Vol. 2 (6) , 649
- https://doi.org/10.1051/mmm:0199100206064900
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Atomic Force MicroscopePhysical Review Letters, 1986