A Data Base Driven Automated System for MOS Device Characterization, Parameter Optimization and Modeling
- 1 January 1984
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 3 (1) , 47-51
- https://doi.org/10.1109/tcad.1984.1270056
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Optimized Extraction of MOS Model ParametersIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1982
- The Simulation of MOS Integrated Circuits Using SPICE2Published by Defense Technical Information Center (DTIC) ,1980
- An analytic charge-sharing predictor model for submicron MOSFETsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1980
- Drift velocity saturation in MOS transistorsIEEE Transactions on Electron Devices, 1970
- Current/voltage characteristics, channel pinchoff and field dependence of carrier velocity in silicon insulated-gate field-effect transistorsElectronics Letters, 1970