Structural Characterization of the Si(111)-CaInterface by High-Resolution Transmission Electron Microscopy
- 7 November 1988
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 61 (19) , 2274
- https://doi.org/10.1103/physrevlett.61.2274
Abstract
DOI: https://doi.org/10.1103/PhysRevLett.61.2274Keywords
This publication has 3 references indexed in Scilit:
- Structure of the Si(111)-CaInterfacePhysical Review Letters, 1988
- Evidence for the influence of interfacial atomic structure on electrical properties at the epitaxial/Si(111) interfacePhysical Review Letters, 1988
- Transformation of three-connected silicon nets in CaSi2Journal of Solid State Chemistry, 1979