A connection between Raman intensities and EXAFS Debye-Waller factors in amorphous solids
- 31 August 1980
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 35 (7) , 565-567
- https://doi.org/10.1016/0038-1098(80)90899-6
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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- Structure determination by X-ray absorptionContemporary Physics, 1978
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- Raman-Scattering Selection-Rule Breaking and the Density of States in Amorphous MaterialsPhysical Review Letters, 1970