Current Crowding Effects at Aluminun-Silicon Contacts

• 1 April 1970
• proceedings article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in 8th Reliability Physics Symposium
• p. 121-126
• https://doi.org/10.1109/irps.1970.362446

Abstract

Keywords

• RESISTORS
• SILICON
• VOLTAGE
• PROXIMITY EFFECT
• CONTACT RESISTANCE
• HEATING
• ALUMINUM
• FAILURE ANALYSIS
• ELECTROMIGRATION