A review of structural defect generation mechanisms in EFG ribbons
- 1 March 1987
- journal article
- review article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 82 (1-2) , 197-202
- https://doi.org/10.1016/0022-0248(87)90186-2
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
- Plastic deformation influence on stress generated during silicon sheet growth at high speedsJournal of Crystal Growth, 1983
- Structural and electrical charaterization of crystallographic defects in silicon ribbonsJournal of Crystal Growth, 1980
- Observations of EFG die material interactions with liquid siliconJournal of Materials Science, 1980
- Electrical effects of SiC inclusions in EFG silicon ribbon solar cellsJournal of Applied Physics, 1976
- Growth and characterization of silicon ribbons produced by a capillary action shaping techniquePhysica Status Solidi (a), 1975
- Edge-defined, film-fed growth (EFG) of silicon ribbonsMaterials Research Bulletin, 1972
- Edge-defined, film-fed crystal growthJournal of Crystal Growth, 1972
- Growth of controlled profile crystals from the melt: Part III — TheoryMaterials Research Bulletin, 1971
- Growth of controlled profile crystals from the melt: Part II - Edge-defined, film-fed growth (EFG)Materials Research Bulletin, 1971
- Growth of controlled profile crystals from the melt: Part I - Sapphire filamentsMaterials Research Bulletin, 1971