Checkerboard Domain Patterns on Epitaxially Grown Single-Crystal Thin Films of Iron, Nickel, and Cobalt
- 1 April 1963
- journal article
- conference paper
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 34 (4) , 1062-1064
- https://doi.org/10.1063/1.1729369
Abstract
Domain structures of epitaxially grown single-crystal thin films of iron, nickel, and cobalt are investigated by the Bitter pattern technique. In the case of iron and cobalt films of (001) orientation, checkerboard patterns are observed, from which the sign of the anisotropy constant can be determined. In the case of nickel, however, no such regular patterns were observed. On Ni films with (110) orientation, however, one can observe an elongated domain in the [110] direction. This seems to indicate that a [100] wall has a higher energy than a [110] wall. The 180° walls in thin films are unstable and tend to have fine structures.This publication has 5 references indexed in Scilit:
- Checkerboard Domain Pattern of Single-Crystal Thin Iron FilmJournal of Applied Physics, 1962
- Domain Structure in Single-Crystal Thin Films of IronJournal of the Physics Society Japan, 1962
- Bitter Patterns on Single-Crystal Thin Films of Iron and NickelJournal of Applied Physics, 1962
- On the domain structure of thin ferromagnetic filmsCzechoslovak Journal of Physics, 1957
- Notizen: Zur Bezirksstruktur dünner EisenschichtenZeitschrift für Naturforschung A, 1956