The Aging Process in Electrical Insulation: A Tutorial Summary

1 September 1972

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electrical Insulation

Vol. EI-7 (3) , 153-157
https://doi.org/10.1109/tei.1972.299199

Abstract

Calculating the life expectancy of electrical insulation is an interesting application of Arrhenius's law. Bussing's analytical treatment is derived for the simple case of life at constant temperature. Its extension to variable temperature conditions is explained as is the application of the same techniques to calculating mechanical failure due to creep and capacitor failure due to electrode diffusion. Lastly, recently developed techniques for rapid determination of the slopes of Arrhenius's-law graphs for insulation life are reviewed.

Keywords

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