A crossed beam high resolution study of dissociative electron attachment to CCl4
- 1 November 1995
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Processes
- Vol. 149-150, 311-319
- https://doi.org/10.1016/0168-1176(95)04265-m
Abstract
No abstract availableKeywords
This publication has 22 references indexed in Scilit:
- The varying influences of gas and electron temperatures on the rates of electron attachment to some selected moleculesJournal of Physics B: Atomic, Molecular and Optical Physics, 1995
- Low-energy electron attachment to molecules studied by pulse-radiolysis microwave-cavity technique combined with microwave heatingThe Journal of Chemical Physics, 1992
- Attachment of electrons to molecules at submillielectronvolt resolutionChemical Physics Letters, 1992
- Rydberg-atom collisions withandat very highnPhysical Review A, 1992
- Use of Rydberg atoms to probe negative ion lifetimesThe Journal of Chemical Physics, 1990
- Dissociative attachment of electrons in the chloromethanesChemical Physics Letters, 1990
- Associative and dissociative electron attachment by SF6 and SF5ClThe Journal of Chemical Physics, 1988
- s-wave threshold in electron attachment: Observations and cross sections inandat ultralow electron energiesPhysical Review A, 1985
- Temperature dependence of electron attachment at low energies for polyatomic moleculesThe Journal of Chemical Physics, 1973
- The temperature dependence of electron attachment to CCl4, CHCl3 and C6H5CH2ClInternational Journal for Radiation Physics and Chemistry, 1971