A double exposure technique for speckle pattern interferometry
- 1 April 1971
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 4 (4) , 277-279
- https://doi.org/10.1088/0022-3735/4/4/004
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Interferometric displacement measurement on scattering surfaces utilizing speckle effectJournal of Physics E: Scientific Instruments, 1970
- Production of Multiple Beam Fringes from Photographic ScatterersOptica Acta: International Journal of Optics, 1968
- Autocorrelation Function and Power Spectral Density of Laser-Produced Speckle PatternsJournal of the Optical Society of America, 1965