The Effects of X-Ray Optics on Residual Stress Measurements in Steel
- 1 January 1973
- journal article
- Published by Cambridge University Press (CUP) in Advances in X-ray Analysis
- Vol. 17, 354-370
- https://doi.org/10.1154/s0376030800005425
Abstract
The effects of various combinations of divergence, receiving and Soller slits on x-ray measurements were investigated for Siemens-Halske and General Electric diffractometers. Influences of the following factors which also affect accuracy and precision of x-ray R.S. results were determined in addition: (a) parafocus versus stationary detector focusing geometry, (b) method of peak location, (c) LPA intensity correction, (d) diffractometer electronic stability and (e) elastic constants. The optimum choiees of beam optics and factors (a-e) were defined with regard to aecuraey, precision and minimurn time for stress deterniination, on sharp and broad line speeimens of soft (annealed) and hardened steel and of annealed Cr-powder.Keywords
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