Physical basis of dielectric breakdown
- 14 July 1980
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 13 (7) , L143-L148
- https://doi.org/10.1088/0022-3727/13/7/008
Abstract
Recent advances in the understanding of the true nature of the dielectric response of solids are applied to the case of dielectric breakdown with its general characteristics of temporal suddenness and spatial discreteness. It is shown that these features can be understood in terms of two novel physical concepts, dielectric localisation and memory track, which both follow from basic physical properties of lossy dielectrics.Keywords
This publication has 4 references indexed in Scilit:
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- Non-exponential decay in dielectrics and dynamics of correlated systemsNature, 1979
- Dielectric loss under transient excitationJournal of Physics C: Solid State Physics, 1978
- The ‘universal’ dielectric responseNature, 1977