Cryo-electron microscopy and applications in the SEM
- 31 December 1985
- journal article
- abstracts
- Published by Elsevier in Ultramicroscopy
- Vol. 17 (2) , 168
- https://doi.org/10.1016/0304-3991(85)90033-6
Abstract
No abstract availableKeywords
This publication has 0 references indexed in Scilit: