Natural line-width effects in gamma- and X-ray emission rate measurements with semiconductor detectors
- 1 June 1981
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 184 (2-3) , 497-503
- https://doi.org/10.1016/0029-554x(81)90753-9
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- X-ray emission probabilities per decay of 152EuNuclear Instruments and Methods, 1979
- Total and partial atomic-level widthsAtomic Data and Nuclear Data Tables, 1974