Low voltage hot-electron effects in short channel MOSFETs

• 1 January 1984
• proceedings article
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• https://doi.org/10.1109/iedm.1984.190650

Abstract

Keywords

• TUNNELING
• CIRCUITS
• LOW VOLTAGE
• SPONTANEOUS EMISSION
• THRESHOLD VOLTAGE
• SCATTERING