Internal non contact testing method using ferroelectric liquid crystals
- 31 May 1990
- journal article
- Published by Elsevier in Microelectronic Engineering
- Vol. 12 (1-4) , 149-156
- https://doi.org/10.1016/0167-9317(90)90027-q
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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