Direct Calibration and Measurement of Microstrip Structures on Gallium Arsenide
- 23 March 2005
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 86 (0149645X) , 629-632
- https://doi.org/10.1109/mwsym.1986.1132265
Abstract
Measurements on coupled microstrip line structures on gallium arsenide are described which uses direct launch and calibration standards in the same microstrip medium. Novel techniques are adopted to ensure repeatability and overcome problems of fragility of the substrates. Measured results show good agreement with theoretical analysis.Keywords
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