Ellipsometric study of a thin transparent film overlaid on a transparent substrate having a surface layer
- 1 August 1969
- journal article
- Published by Elsevier in Surface Science
- Vol. 16, 275-287
- https://doi.org/10.1016/0039-6028(69)90024-7
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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- Optical Determination of Thin Films on Reflecting Bases in Transparent EnvironmentsJournal of the Optical Society of America, 1948
- Optical methods of studying films on reflecting bases depending on polarisation and interference phenomenaTransactions of the Faraday Society, 1946
- A New Method for Investigating the Refractive Index and the Thickness of Thin Interference Films on GlassPhysical Review B, 1940
- An Optical Investigation of Oxide Films on MetalsJournal of the Optical Society of America, 1939
- Ueber die Reflexion und Brechung ebener Lichtwellen beim Durchgang durch eine mit Oberflächenschichten behaftete planparallele PlatteAnnalen der Physik, 1891