A correction method of matrix, density and thickness effects in thin samples analysed by X-ray fluorescence spectrometry
- 1 January 1980
- journal article
- Published by Elsevier in Spectrochimica Acta Part B: Atomic Spectroscopy
- Vol. 35 (7) , 385-400
- https://doi.org/10.1016/0584-8547(80)80073-5
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Analysis of powdered materials by X-ray fluorescence spectrometry. Evaluation and correction of the interferencesX-Ray Spectrometry, 1975
- X-ray fluorescence spectrometry on variable thin deposits of powdered materialsX-Ray Spectrometry, 1974