Examination of Sputtered Ion Mechanisms Leading to the Formation of C7H7+ during Surface Induced Dissociation (SID) Tandem Mass Spectrometry (MS/MS) of Benzene Molecular Cations
- 1 January 1996
- journal article
- Published by American Chemical Society (ACS) in Journal of the American Chemical Society
- Vol. 118 (35) , 8375-8380
- https://doi.org/10.1021/ja960332x
Abstract
No abstract availableThis publication has 21 references indexed in Scilit:
- Surface-induced Dissociation: An Effective Tool to Probe Structure, Energetics and Fragmentation Mechanisms of Protonated PeptidesJournal of Mass Spectrometry, 1996
- Sputtered protons during surface-induced dissociation (SID) tandem mass spectrometry (MS/MS)International Journal of Mass Spectrometry and Ion Processes, 1995
- Reactions of ions with organic surfacesAccounts of Chemical Research, 1994
- Surface MS: Probing Real-World SamplesAnalytical Chemistry, 1993
- Reactive collisions of benzene ion C6H6.bul.+ and C6D6.bul.+ at self-assembled monolayer films prepared on gold from n-alkane thiols and a fluorinated alkanethiol: the influence of chain length on the reactivity of the films and the neutralization of the projectileJournal of the American Chemical Society, 1993
- Polyatomic ion/surface collisions at self-assembled monolayers filmsJournal of the American Chemical Society, 1991
- Surface reactions and surface-induced dissociation of polyatomic ions at self-assembled organic monolayer surfacesJournal of the American Chemical Society, 1991
- Collisions of polyatomic ions with surfacesInternational Journal of Mass Spectrometry and Ion Processes, 1990
- Ion/surface collisions for distinction of isomeric [C6H6].cntdot.+ and [C6H6]2+ ionsJournal of the American Chemical Society, 1988
- Reactive collisions of polyatomic ions at solid surfacesInternational Journal of Mass Spectrometry and Ion Processes, 1988