Contactless electroreflectance characterization of three InGaAs quantum wells placed in a GaAs/AlGaAs resonant cavity
- 30 June 1996
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 39 (6) , 871-874
- https://doi.org/10.1016/0038-1101(95)00388-6
Abstract
No abstract availableKeywords
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