A new background subtraction for low‐energy EELS core edges

• 1 June 1992
• journal article
• Published by Wiley in Journal of Microscopy
• Vol. 166  (3) , 297-306
• https://doi.org/10.1111/j.1365-2818.1992.tb01529.x

Abstract

Keywords

• ELECTRON ENERGY‐LOSS SPECTROSCOPY
• QUANTITATIVE ANALYSIS
• BACKGROUND SUBTRACTION
• NEW THREE‐PARAMETER FUNCTION
• LOW ENERGY LOSSES
• MEDIUM‐THICK SPECIMENS
• SILICON OXIDE