Contact Resistance Measurements at Low Loads

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Abstract
A modification of the fine-wire loop technique for studying surface contact resistances, as developed originally by Savage and Flom, is described. The principal change is substitution of quartz fiber for platinum wire as the resilient part of the probe. The contact end of the probe consists of either platinum or gold—other metals could be used as well. An additional improvement is the provision for gradually increasing the applied force between the probe and surface at a low, known rate. This can provide information, not only on the electrical and physical durability of the film, but also on the changing bulk characteristics of the contact junction. Applications in which the quartz fiber probe has been used for studying silver-plated aluminum contacts, gold-plated silver contacts, and copper-Teflon films on copper are discussed.

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