Breakdown of Thin-Film Emitters
- 1 January 1972
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 43 (1) , 242-243
- https://doi.org/10.1063/1.1660820
Abstract
The examination of thin‐film emitters in the scanning electron microscope has revealed a mechanism by which they break down. The top film is continuous when emission is first obtained from the device but microscopic punctures appear after a short period of operation and the emission becomes unstable. Eventually the device ceases to conduct as the number and size of the micropunctures increase.This publication has 4 references indexed in Scilit:
- A New High Resolution Reflection Scanning Electron MicroscopeReview of Scientific Instruments, 1969
- Electron Emission, Electroluminescence, and Voltage-Controlled Negative Resistance in Al–Al2O3–Au DiodesJournal of Applied Physics, 1965
- Structural Effects in Thin-Film Sandwich EmittersJournal of Applied Physics, 1964
- CorrespondenceProceedings of the IRE, 1960