Measurement of the anisotropy ratio during current-induced step bunching

This publication has 28 references indexed in Scilit:

• Current-Induced Faceting of Crystal Surfaces
  Physical Review Letters, 1994
• Step motions on high-temperature vicinal surfaces
  Journal of Physics: Condensed Matter, 1994
• High atom density in the ‘‘1×1’’ phase and origin of the metastable reconstructions on Si(111)
  Physical Review Letters, 1994
• Dynamics of Step Bunching Induced by DC Resistive Heating of Si Wafer
  Japanese Journal of Applied Physics, 1994
• Dynamics of step flow in a model of heteroepitaxy
  Physical Review B, 1992
• Kinetic smoothing and roughening of a step with surface diffusion
  Physical Review Letters, 1992
• DC-Resistive-Heating-Induced Step Bunching on Vicinal Si (111)
  Japanese Journal of Applied Physics, 1990
• Initial stages of silicon homoepitaxy studied by in situ reflection electron microscopy
  Physica Status Solidi (a), 1989
• Electromigration in metals
  Reports on Progress in Physics, 1989
• The growth of crystals and the equilibrium structure of their surfaces
  Philosophical Transactions of the Royal Society of London. Series A, Mathematical and Physical Sciences, 1951