Trace element analysis by ion induced X-ray emission spectroscopy
- 1 April 1977
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 142 (1-2) , 39-44
- https://doi.org/10.1016/0029-554x(77)90804-7
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Sensitivity in trace-element analysis by p, α and 16O induced X-raysNuclear Instruments and Methods, 1974
- Proton induced X-ray emission as a tool for trace element analysisNuclear Instruments and Methods, 1974
- Inner-Shell Vacancy Production in Ion-Atom CollisionsReviews of Modern Physics, 1973
- X-Ray Fluorescence Yields, Auger, and Coster-Kronig Transition ProbabilitiesReviews of Modern Physics, 1972
- X-ray analysis: Elemental trace analysis at the 10−12 g levelNuclear Instruments and Methods, 1970