Apparatus for X-Ray Diffraction Studies of Metals under Controlled Stress at Elevated Temperature

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Abstract
A Geiger‐counter x‐ray spectrometer was constructed for the dynamic study of phase changes and other phenomena in metals under controlled stress conditions at elevated temperatures. Temperature could be controlled from room temperature to the melting point of steel, and stress was independently varied from zero stress to the breaking stress of stainless steel. Applications included isothermal and athermal transformation studies under tensile stress in pearlite, bainite, and martensite.