Electrical resistance tomography for process applications
- 1 March 1996
- journal article
- Published by IOP Publishing in Measurement Science and Technology
- Vol. 7 (3) , 247-260
- https://doi.org/10.1088/0957-0233/7/3/005
Abstract
Measurement of electrical resistivity via four probes is widely used in a variety of applications ranging from geophysical prospecting to silicon wafer manufacture. Electrical resistivity tomography is an extension of this approach and is performed via an array of equi-spaced electrodes mounted into the periphery of a process vessel to map non-intrusively the spatial distribution of resistivities within. The digitized boundary data are `inverted' by an image reconstruction algorithm to produce a map of the internal resistivity distribution. This paper focuses on the design and operation of flexible electrical resistivity tomography instrumentation for use on laboratory- and plant-scale process equipment.Keywords
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