Some Problems in the Diffusion of Minority Carriers in a Semiconductor
- 1 January 1954
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 25 (1) , 99-102
- https://doi.org/10.1063/1.1721530
Abstract
The exact solutions to the problems of the diffusion of minority carriers involved in the measurement of surface-recombination velocity in a semiconductor with a sample geometry bounded by two infinite planes are presented. The reduction of the exact solutions to simple forms used in the analysis of experimental data is shown.This publication has 1 reference indexed in Scilit:
- Measurement of Minority Carrier Lifetime in GermaniumProceedings of the IRE, 1952