Relating potato yield to the level of soil degradation using a bulk yield monitor and differential global positioning systems
- 1 August 1999
- journal article
- Published by Elsevier in Computers and Electronics in Agriculture
- Vol. 23 (2) , 133-143
- https://doi.org/10.1016/s0168-1699(99)00027-7
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- PENETRATION RESISTANCE TO CHARACTERIZE THE DEPTH AND PERSISTENCE OF SOIL LOOSENING IN TILLAGE STUDIESCanadian Journal of Soil Science, 1988
- Relationship between Soil Physical Properties and Crop ProductionPublished by Springer Nature ,1958