Waveguide Breakdown Effects at High Average Power and Long Pulse Length
- 1 November 1972
- journal article
- website
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Bell System Technical Journal
- Vol. 51 (9) , 2065-2091
- https://doi.org/10.1002/j.1538-7305.1972.tb02700.x
Abstract
Analytical predictions of the power handling capabilities of waveguide systems generally have not considered the effects of high average power and long pulse length. It has experimentally been noted, however, that a substantial reduction in power handling capability below expected levels does occur as average power and pulse length are increased. This reduction can be attributed to the presence of loose particulate matter which is heated by the average power, causing localized rarefication of the dielectric gas fill as well as the expected voltage enhancement. An unstable arcing situation is shown to exist when the arc duration exceeds some critical time. Typical pulse lengths in use today exceed this critical time and may result in continuous arcing. The use of control circuitry to terminate each particle-induced arc prevents continuous arcing and deletes the particle, and is therefore essential to stable operation at long pulse lengths and high average power.Keywords
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