The new Oxford scanning proton microprobe analytical facility

This publication has 9 references indexed in Scilit:

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• Focused MeV beam line for microanalysis at Osaka
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• Simultaneous compensation of 2nd-order parasitic aberrations in both principal sections of an achromatic quadrupole lens doublet
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1988
• Focusing protons and light ions to micron and submicron dimensions
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1988
• Aberrations of single magnetic quadrupole lenses
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1987
• Algorithms for the rapid simulation of Rutherford backscattering spectra
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1985
• The Oxford 1 μm proton microprobe
  Nuclear Instruments and Methods in Physics Research, 1982
• Polarization of Protons Elastically Scattered by Oxygen
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• Levels of ${\mathrm{P}}^{29}$ from ${\mathrm{Si}}^{28}(p, p){\mathrm{Si}}^{28}$ and ${\mathrm{Si}}^{28}(p, p^{\prime }){\mathrm{Si}}^{28*}$
  Physical Review B, 1959