Direct measurement ofions produced by Compton scattering between 2.5 and 5.5 keV
- 23 May 1994
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 72 (21) , 3329-3331
- https://doi.org/10.1103/physrevlett.72.3329
Abstract
The relative cross sections for Compton scattering have been measured between 2.5 and 5.5 keV. By measuring the number of ions produced with near zero recoil energies it was possible to identify ions produced by Compton scattering from those produced by photoionization. The results have been placed on an absolute basis by normalization to recent calculations.
Keywords
This publication has 10 references indexed in Scilit:
- Contribution of Compton scattering to the double ionization of heliumPhysical Review Letters, 1994
- Compton scattering of photons from bound electrons: Full relativistic independent-particle-approximation calculationsPhysical Review A, 1993
- Excitation ionization and double ionization of helium by high-energy photon impactPhysical Review Letters, 1993
- Comment on ‘‘Measurement of the ratio of double-to-single photoionization of helium at 2.8 keV using synchrotron radiation’’Physical Review Letters, 1993
- Inelastic scattering of X-rays and gamma rays by inner shell electronsPhysics Reports, 1992
- Atomic form factors, incoherent scattering functions, and photon scattering cross sectionsJournal of Physical and Chemical Reference Data, 1975
- Photon cross sections from 0.1 keV to 1 MeV for elements Z = 1 to Z = 94Atomic Data and Nuclear Data Tables, 1973
- Compton Scattering by-Shell Electrons. I. Nonrelativistic Theory with RetardationPhysical Review A, 1972
- The Spectrum of Scattered X-RaysPhysical Review B, 1923
- A Quantum Theory of the Scattering of X-rays by Light ElementsPhysical Review B, 1923