New method for the characterization of domain morphology of polymer blends using ruthenium tetroxide staining and low voltage scanning electron microscopy (LVSEM)
- 1 July 1997
- Vol. 38 (15) , 3937-3945
- https://doi.org/10.1016/s0032-3861(96)00962-7
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Low-voltage scanning electron microscopy of polymersPolymer, 1995
- Phase morphology of polymer blends: 2. SEM observation by secondary and backscattered electrons from microtomed and stained surfacePolymer, 1993
- Phase morphology of polymer blends: scanning electron microscope observation by backscattering from a microtomed and stained surfacePolymer, 1992
- The theory and practice of high-resolution scanning electron microscopyUltramicroscopy, 1991
- Characterization of polymer blends and block copolymers by conventional and low voltage SEMScanning, 1990
- Characterization of polymer blends by low voltage scanning electron microscopyScanning, 1988
- Lamellar morphologies of melt-crystallized polyethylene, isotactic polypropylene and ethylene-propylene copolymers by the RuO4 staining techniquePolymer, 1986
- The use of ruthenium in hypochlorite as a stain for polymeric materialsJournal of Polymer Science Part C: Polymer Letters, 1985
- Ruthenium tetraoxide staining of polymers for electron microscopyMacromolecules, 1983
- Structure and properties of rubber-modified polypropylene impact blendsJournal of Applied Polymer Science, 1981